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High resolution electron microscopy on superconducting YBa2Cu3O7thin films

Authors
Journal
Thin Solid Films
0040-6090
Publisher
Elsevier
Publication Date
Volume
228
Identifiers
DOI: 10.1016/0040-6090(93)90592-d
Disciplines
  • Physics

Abstract

Abstract Several examples of the use of high resolution electron microscopy for the characterization of the microstructure of thin films of YBa 2Cu 3O 7 are given. It is argued that the sample preparation (cross-section preparation) is a very crucial part of the high T c superconducting films as well as the interpretation of the high resolution images. Examples are shown of a Josephson junction on yttria-stabilized ZrO 2, YBa 2Cu 3O 7 on MgO, a La 2CuO 4YBa 2Cu 3O 7 La 2CuO 4 multilayer and the effect of the electron beam on the interface of a YBa 2Cu 3O 7SrTiO 3 interface.

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