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Novel disposable bismuth-sputtered electrodes for the determination of trace metals by stripping voltammetry

Authors
Journal
Electrochemistry Communications
1388-2481
Publisher
Elsevier
Publication Date
Volume
9
Issue
12
Identifiers
DOI: 10.1016/j.elecom.2007.09.022
Keywords
  • Stripping Analysis
  • Trace Analysis
  • Bismuth Electrodes
  • Sputtering
Disciplines
  • Chemistry

Abstract

Abstract This work describes a novel type of bismuth electrode for stripping voltammetry based on coating a silicon substrate with a thin bismuth film by means of sputtering. The bismuth-based sensors were characterized by optical methods (scanning electron microscopy (SEM), atomic force microscopy (AFM) and X-ray diffraction (XRD)) and as well as by linear sweep voltammetry. Subsequently, the electrodes were tested for the detection of low concentrations of trace metals (Cd(II), Pb(II) and Ni(II)) by stripping voltammetry. Well-formed stripping peaks were observed for trace concentrations of the target analytes demonstrating “proof-of-principle” for these sensors. This type of electrochemical device, utilizing thin-film technology for the formation of the bismuth film, holds promise for future applications in trace metal analysis.

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