Affordable Access

Publisher Website

High resolution electron microscopic study of tin dioxide crystals

Authors
Journal
Journal of Solid State Chemistry
0022-4596
Publisher
Elsevier
Publication Date
Volume
50
Issue
1
Identifiers
DOI: 10.1016/0022-4596(83)90232-3

Abstract

Abstract Crystals of Sb-doped tin dioxide have been examined by high resolution electron microscopy (≤2.3 Å point-to-point resolution) in [100], [001], and [1 111] zone axes projections, and images of twin interfaces, inclined defects, and a possible crystallographic shear plane have been recorded. Image simulations confirmed that the metal atom rows have been clearly resolved in each of these three low-index projections for specific electron-optical conditions. Image observation and consideration of the possible atomic arrangements about a (011)-type twin interface suggested that this resulted from a glide operation given by 1 2 〈1 11〉 (011) and a very close match with an experimental through-focal series was obtained using computer image simulations. The structural determination of crystal defects by high resolution electron microscopy is briefly discussed.

There are no comments yet on this publication. Be the first to share your thoughts.

Statistics

Seen <100 times
0 Comments

More articles like this

High resolution electron microscopic study of the...

on Journal of Crystal Growth Jan 01, 1981

High-resolution electron-microscopic study of the...

on Cell and tissue research September 2000

High resolution electron microscopic observation o...

on Journal of electron microscopy April 1994

High-resolution electron microscopic study of V6O1...

on Journal of Solid State Chemist... Jan 01, 1985
More articles like this..