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Polycrystallisation of amorphous thin films of Zn3P2

Authors
Journal
Vacuum
0042-207X
Publisher
Elsevier
Publication Date
Volume
50
Identifiers
DOI: 10.1016/s0042-207x(98)00029-3
Keywords
  • Thin Films
  • Structure And Basic Physical Properties

Abstract

Abstract The amorphous thin films of Zn 3P 2 were elaborated by evaporation in vacuum on cold substrates. The polycrystalline samples were obtained by annealing in vacuum for several hours in temperatures T = 100−250 °C. The evolution of physical properties of layers vs. annealing temperature were studied by means of transmission and reflectivity measurements in wide energy range E = 1.38 – 5.5 eV. The rate of short and long range ordering of ions in crystal lattice after annealing were considered.

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