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Quantitative descriptions of periodic layer formation during solid state reactions

Authors
Journal
Materials Science and Engineering A
0921-5093
Publisher
Elsevier
Publication Date
Volume
362
Identifiers
DOI: 10.1016/s0921-5093(03)00479-9
Keywords
  • Pattern Formation
  • Periodic Layer Formation
  • Theory And Modeling
  • Diffusion-Induced Stresses
  • Interface Control

Abstract

Abstract Periodic layer formation during solid state reactions is related to the stresses induced by the difference in interface growth rate of the two phases within the layer. When the elastic deformation of the slow-growing phase reaches its elastic maximum, it would be split up from the reaction front and the layer separating occurs. Theoretical model describes systematically the patterns formed in various systems and explains almost all of the experimental facts. It also predicts that the reactive diffusion system Zn/Co 2Si should be interface controlled and system Zn/Fe 3Si be mixed-controlled.

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