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Specular reflection model study of the image effect in He+/a:Si scattering at low energy

Authors
Journal
Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms
0168-583X
Publisher
Elsevier
Publication Date
Volume
230
Identifiers
DOI: 10.1016/j.nimb.2004.12.037
Disciplines
  • Mathematics

Abstract

Abstract Electronic polarization induced by low energy ions near solid surfaces at grazing incidence considerably modifies the collision geometry. This effect is studied by the comparison between experimental and simulated time of flight (ToF) spectra of helium ions scattered from amorphous Si for small incidence and emergence angles. In this work, we include the image effect and the external stopping power in a simulation code through the Specular Reflection Model (SRM). The image potential is computed by using the dielectric surface functions in the Random Phase Approximation (RPA), Plasmon Line Approximation (PLA) and static Thomas–Fermi approximation. With the later, it is found a better agreement with the experiment for the ionic part of the spectra.

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