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Glass leaching studies by sputter-induced photon spectrometry (SIPS)

Authors
Journal
Journal of Non-Crystalline Solids
0022-3093
Publisher
Elsevier
Publication Date
Identifiers
DOI: 10.1016/0022-3093(80)90510-4
Disciplines
  • Physics

Abstract

Abstract The effect of composition on the leaching behavior of soda-lime silicate glasses is studied by depth-profiling using the sputter-induced photon spectrometry (SIPS) technique on hydrated glasses of variable Na 2O and CaO contents. In addition, the increase in the thickness of the leached layers as a function of hydration time for the 18Na 2O·12CaO·70SiO 2 glass is also determined. The results indicate that a mechanism of interdiffusion is in operation and the diffusion coefficients for hydrogen and sodium are calculated using the Doremus model of interdiffusing ions.

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