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Photoemission (UPS and XPS) study of local structures of amorphous GeTe and GeSe films

Authors
Journal
Journal of Non-Crystalline Solids
0022-3093
Publisher
Elsevier
Publication Date
Identifiers
DOI: 10.1016/0022-3093(83)90310-1

Abstract

Abstract In situ photoemission (UPS and XPS) measurements have been performed for amorphous GeTe and GeSe films deposited onto a cooled substrate during thermal annealing and crystallization of the films. It has been found that an amorphous film prepared at room temperature has a 4-2 coordinated local structure while a highly disordered film deposited onto a 77 K substrate is largely 3-3 coordinated and relaxes into the 4-2 coordinated structure upon thermal annealing.

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