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Equivalent circuits for transients inp-njunctions and solar cells with their application to methods for minority carrier life-time measurements

Authors
Journal
Solid-State Electronics
0038-1101
Publisher
Elsevier
Publication Date
Volume
27
Issue
10
Identifiers
DOI: 10.1016/0038-1101(84)90003-0

Abstract

Abstract Equivalent circuits corresponding to series solutions obtainable under various operating conditions of p- n junctions and solar cells are given. These circuits are directly applicable to the small signal impedance measurements. The transient behaviour of the p- n junction devices during minority carrier lifetime determination experiments has also been explained successfully with the help of these circuits. This provides a better insight towards the physical processes involved in these methods and interpretation of the various experimental results becomes easier.

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