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Invisible layers in ellipsometry

Authors
Journal
Thin Solid Films
0040-6090
Publisher
Elsevier
Publication Date
Volume
234
Identifiers
DOI: 10.1016/0040-6090(93)90330-r

Abstract

Abstract In this paper we discuss the conditions for the invisibility of some layers in ellipsometry. The reason for such invisibility may be anisotropy. In this situation the thin films cannot be observed by changing the incidence angle. To investigate such films we have to change the ambient medium or the spectral area. A number of examples of such layers are presented.

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