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Dislocation structure misorientations measured with an automated electron diffraction pattern indexing tool

Authors
Journal
Materials Science and Engineering A
0921-5093
Publisher
Elsevier
Publication Date
Volume
462
Identifiers
DOI: 10.1016/j.msea.2005.12.112
Keywords
  • Dislocation Structure
  • Transmission Electron Microscopy
  • Misorientations

Abstract

Abstract The substructures of deformed Fe–1.5%Cu alloys are investigated by use of a transmission electron microscope (TEM). The aspect of the substructure as observed in classical bright-field mode is compared with the average misorientation gradient deduced from orientation maps collected with an automated diffraction pattern indexing tool. It is shown that a significant part of the dislocation boundaries are not detectable through misorientation measurements.

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