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A combined AP-FIM/HREM approach to the characterization of microstructure in a Mn-added TiAl intermetallic compound

Authors
Journal
Surface Science
0039-6028
Publisher
Elsevier
Publication Date
Volume
246
Identifiers
DOI: 10.1016/0039-6028(91)90420-w
Disciplines
  • Chemistry

Abstract

Abstract Analytical techniques of atom probe-field ion microscopy (AP-FIM) and high resolution electron microscopy (HREM) are well suited to the microcharacterization of microstructures. By combining AP-FIM with HREM, it is possible to obtain more accurate structural and chemical information of microstructures. This paper reports the first HREM observation of the tip specimen for AP-FIM analysis. In the present study, the advantage of the combined AP-FIM/HREM technique is demonstrated through the characterization of microstructures in a Mn-added TiAl intermetallic compound.

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