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Ultrahigh vacuum evaporation of thin antimony films onto carbon substrates

Authors
Journal
Thin Solid Films
0040-6090
Publisher
Elsevier
Publication Date
Volume
29
Issue
1
Identifiers
DOI: 10.1016/0040-6090(75)90210-2
Disciplines
  • Philosophy

Abstract

Abstract Measurements have been made of the island density in UHV-deposited films of antimony of various thicknesses and the distribution of particle sizes has been determined. The crystallographic nature of the films has been studied by transmission electron diffraction and dark-field electron microscopy; and by in situ measurement of the electrical resistance during film growth thethickness at which electrical continuity occurs has been determined. It is shown that films of antimony deposited onto amorphous carbon exhibit a phase transition upon coalescence, becoming highly oriented in structure.

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