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Reliability evaluation of human operators under stress

Authors
Journal
Microelectronics Reliability
0026-2714
Publisher
Elsevier
Publication Date
Volume
25
Issue
4
Identifiers
DOI: 10.1016/0026-2714(85)90408-1

Abstract

Abstract This paper presents five newly developed models to predict reliability of human operators performing time continous tasks under stress. Laplace transforms of state probability equations and operator reliability are developed. Mean time to human error (MTTHE) expressions are obtained. In addition specific plots are shown for selective models.

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