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Interaction of dopants with intrinsic structural defects in vitreous silica

Authors
Journal
Journal of Non-Crystalline Solids
0022-3093
Publisher
Elsevier
Publication Date
Volume
108
Issue
2
Identifiers
DOI: 10.1016/0022-3093(89)90583-8
Disciplines
  • Chemistry

Abstract

Abstract The interactions of germanium, boron, phosphorus and fluorine dopants with the defect sites of vitreous silica were studied by the Raman spectroscopy method. The scattering cross sections of Raman lines associated with SiOGe, SiOB, P=0 and SiF structural groups were found, which made it possible to determine directly from spectra the absolute values of concentrations of the dopants listed. The incorporation of dopants into silica was shown to occur mainly over the defect sites of a silica network. The defects play the most significant role when germanium is incorporated, which is explained, apparently, by the structural similarity of silicate and germanate glasses. The generation of chemical groups of the GeO 2 phase (GeOGe) in place of defect sites was noticed. A similar effect was not observed for boron and phosphorus groups. The nature of defect sites responsible for 606 and 490 cm −1 Raman lines is discussed.

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