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Controllo ottico automatizzato di circuiti fotonici integrati: Progettazione, realizzazione e valutazione

Publication Date
  • Photonic Integrated Circuit
  • Automatic Test Equipment
  • Semiconductor Optical Amplifiers
  • Semiconductor Device Testing
  • Optical Waveguides
  • Scuola :: 843884 :: Ingegneria E Architettura
  • Cds :: 0932 :: Ingegneria Delle Telecomunicazioni [Lm-Dm270]
  • Indirizzo :: 903 :: Ingegneria Delle Telecomunicazioni
  • Sessione :: Terza
  • Design
  • Physics


In this report a new automated optical test for next generation of photonic integrated circuits (PICs) is provided by the test-bed design and assessment. After a briefly analysis of critical problems of actual optical tests, the main test features are defined: automation and flexibility, relaxed alignment procedure, speed up of entire test and data reliability. After studying varied solutions, the test-bed components are defined to be lens array, photo-detector array, and software controller. Each device is studied and calibrated, the spatial resolution, and reliability against interference at the photo-detector array are studied. The software is programmed in order to manage both PIC input, and photo-detector array output as well as data analysis. The test is validated by analysing state-of-art 16 ports PIC: the waveguide location, current versus power, and time-spatial power distribution are measured as well as the optical continuity of an entire path of PIC. Complexity, alignment tolerance, time of measurement are also discussed.

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