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Structural phase transitions in Bi2V1−xGexO5.5−x/2(x = 0.2, 0.4, and 0.6) single crystals: x-ray crystallographic study

Authors
Journal
Materials Research Bulletin
0025-5408
Publisher
Elsevier
Publication Date
Volume
34
Issue
3
Identifiers
DOI: 10.1016/s0025-5408(99)00026-4
Keywords
  • D. Crystal Structure
  • C. X-Ray Diffraction
  • D. Ferroelectricity
  • D. Phase Transitions

Abstract

Abstract Single crystals of Bi 2V 1−xGe xO 5.5−x/2 (x = 0.2, 0.4, and 0.6) were grown by slow cooling of melts. Bismuth vanadate transforms from an orthorhombic to a tetragonal structure and subsequently to an orthorhombic system when the Ge 4+ concentration was varied from x = 0.2 to x = 0.6. All of these compositions crystallized in polar space groups ( Aba2, F4 mm, and Fmm2 for x = 0.2, 0.4, and 0.6, respectively). The structures were fully determined by single crystal X-ray diffraction studies.

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