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Local orientation measurements in 3D

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  • The 3 Dimensional X-Ray Diffraction (3Dxrd) Method Is Presented And Its Potentials Illustrated By Ex
  • The 3Dxrd Method Is Based On Diffraction Of High Energy X-Rays And Allows Fast And Nondestructive 3D
  • The Spatial Resolution Is About 1X5X5 Mu M But Diffraction From Microstructural Elements As Small As
  • As Examples Of The Use Of The 3Dxrd Method
  • It Is Chosen To Present Results For Complete 3D Characterization Of Grain Structures
  • In-Situ "Filming" Of The Growth Of One Interior Grain During Recrystallization
  • Recrystallization Kinetics Of Individual Grains And Crystallographic Rotations Of Individual Grains


Local orientation measurements in 3D - DTU Orbit (19/06/14) Local orientation measurements in 3D - DTU Orbit (19/06/14) Local orientation measurements in 3D The 3 Dimensional X-Ray Diffraction (3DXRD) method is presented and its potentials illustrated by examples. The 3DXRD method is based on diffraction of high energy X-rays and allows fast and nondestructive 3D characterization of the local distribution of crystallographic orientations in the bulk. The spatial resolution is about 1x5x5 mu m but diffraction from microstructural elements as small as 100 nm may be monitored within suitable samples. As examples of the use of the 3DXRD method, it is chosen to present results for complete 3D characterization of grain structures, in-situ "filming" of the growth of one interior grain during recrystallization, recrystallization kinetics of individual grains and crystallographic rotations of individual grains during tensile deformation. General information State: Published Organisations: Risø National Laboratory for Sustainable Energy Authors: Juul Jensen, D. (Intern) Pages: 49-54 Publication date: 2005 Conference: International conference on texture and Anisotropy of Polycrystals II (ITAP 2), Metz (FR), 7-9 Jul, 01/01/04 Main Research Area: Technical/natural sciences Publication information Journal: Solid State Phenomena Volume: 105 ISSN (Print): 1012-0394 Ratings: FI (2012): 1 ISI indexed (2012): yes FI (2011): 1 ISI indexed (2011): yes FI (2010): 1 FI (2009): 1 FI (2008): 1 Original language: English Source: orbit Source-ID: 308305 Publication: Research - peer-review › Conference article – Annual report year: 2005

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