Affordable Access

Publisher Website

Aberrations of plane-symmetric multi-element optical systems

Authors
Journal
Optik - International Journal for Light and Electron Optics
0030-4026
Publisher
Elsevier
Publication Date
Volume
121
Issue
13
Identifiers
DOI: 10.1016/j.ijleo.2009.01.016
Keywords
  • Aberrations
  • Optical Design
  • Xuv Optics
  • Ray Tracing

Abstract

Abstract Based on a recently developed aberration theory of plane-symmetric grating systems, its aberration coefficients are firstly extended to be applicable to the plane-symmetric refractive optical surface. To justify the linear approximation of aperture ray in a multi-element system, the ray aberrations of double-element systems with the third-order accuracy of aperture ray are derived and expressed as the form of wave aberrations. The numerical comparisons are then made between the ray tracing, the aberration expressions with the linear and with third-order accuracy of the aperture ray. Moreover, the modifications of the wave and ray aberrations are discussed in the paper when the position of the principal ray changes.

There are no comments yet on this publication. Be the first to share your thoughts.