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Analysis of TOF-SIMS spectra from fullerene compounds

Authors
Journal
Applied Surface Science
0169-4332
Publisher
Elsevier
Publication Date
Volume
255
Issue
4
Identifiers
DOI: 10.1016/j.apsusc.2008.05.227
Keywords
  • Tof-Sims
  • Gold Cluster Ion
  • Intensity Enhancement
  • Fullerene
  • Fragmentation
  • C2Depletion

Abstract

Abstract We analyzed TOF-SIMS spectra obtained from three different size of fullerenes (C 60, C 70 and C 84) by using Ga +, Au + and Au 3 + primary ion beams and investigated the fragmentation patterns, the enhancement of secondary ion yields and the restraint of fragmentation by using cluster primary ion beams compared with monoatomic primary ion beams. In the TOS-SIMS spectra from C 70 and C 84, it was found that a fragment ion, identified as C 60 + ( m/ z = 720), showed a relatively high intensity compared with that of other fragment ions related to C 2 depletion. It was also found that the Au 3 + bombardment caused intensity enhancement of intact molecules (C 60 +, C 70 + and C 84 +) and restrained the fragmentation due to C 2 depletion.

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