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Near-field EMC study to improve electronic component reliability

Authors
Journal
Microelectronics Reliability
0026-2714
Publisher
Elsevier
Publication Date
Volume
47
Identifiers
DOI: 10.1016/j.microrel.2007.07.044
Disciplines
  • Physics

Abstract

Abstract This paper deals with the study of near-field electromagnetic compatibility (EMC) characterisation of electronic devices in order to improve their reliability in the context of the embedded electronic systems where the proximity of RF blocks and digital parts on the same circuits or in the same package increases. Such juxtaposition can lead to more important electromagnetic interferences inducing functional failures and the knowledge of EM behaviour of electronics becomes necessary. After a brief theoretical approach description, the experimental study is detailed. Simulations and measurements are performed and evidence the frequency range of device susceptibility.

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