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Vybrané metody pro studium povrchu pevných látek

Authors
Publication Date
Keywords
  • Sims
  • Afm
  • Iss
  • Solid State
  • Surface
  • Leed
  • Spectroscopy

Abstract

In this paper there are basic characterizations and equipments of LEED, RHEED, ISS, SIMS, AFM and TPD methods for study of properties and characterization of solid state surfaces.

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