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On a method for comparison of pseudo-random number generators

Authors
Journal
Microelectronics Reliability
0026-2714
Publisher
Elsevier
Publication Date
Volume
34
Issue
9
Identifiers
DOI: 10.1016/0026-2714(94)90467-7

Abstract

Abstract In this study a method for comparison of pseudo-random number generators proposed recently by Brkic [1] is reexamined. The correct application of the test is indicated and rejection regions are constructed using the distribution function of the test statistic. The results are demonstrated on various random number generators.

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