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Measurement of L X-Ray relative intensities for selected heavy elements

Authors
Journal
Radiation Physics and Chemistry
0969-806X
Publisher
Elsevier
Volume
87
Identifiers
DOI: 10.1016/j.radphyschem.2013.02.022
Keywords
  • X-Ray
  • Relative Intensities
  • Xrf
  • Xrf Cross-Section

Abstract

Abstract The L-shell X-ray relative intensities I(Ll/Lα), I(Lβ/Lα) and I(Lγ/Lα) for Ba, Pr, Pt, Hg, and Bi, have been measured at the excitation energy of 20.48keV. Measurements have been performed using a system that consists of X-ray tube as an excitation source and Si(Li) detector. Theoretical values of the relative intensities have been calculated using theoretical values of L-subshell ionization cross-sections, L-subshell fluorescence yields, Coster–Kronig probabilities and fractional X-ray emissions. Experimental results have been compared with the theoretically calculated values. The measured values showed reasonable agreement with theoretical values.

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