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Characterisation of active loads for MMIC's

Publication Date
  • Ing-Inf/01 Elettronica


Active loads have been fabricated and tested, and their characterisation addressed for use in microwave CAD programs. The first results show that non-ideal (parasitic) effects are present that can easily be evaluated. Comparison with a three-terminal FET structure shows that a characterisation in terms of an equivalent circuit is feasible, and suggests a possible procedure for the extraction.

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