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Interferometric generation of counter lines on opaque objects

Authors
Journal
Optics Communications
0030-4018
Publisher
Elsevier
Publication Date
Volume
1
Issue
1
Identifiers
DOI: 10.1016/0030-4018(69)90077-7
Disciplines
  • Engineering
  • Mathematics

Abstract

Abstract An interferometric version of a Lichtschnittverfahren is described. A photograph of an object on which is cast a closely spaced Young's fringe pattern is illuminated by a coherent pair of plane wavefronts, producing contour-line fringes whose successive interval can be chosen at will to represent the height difference of around ten microns. Some experimental results were obtained and proved encouraging for the measurement of engineering components of complicated geometries whose tolerances in manufacturing are in the order of microns.

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