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Electrical instability of A-Si:H/SiN thin film transistors : a study at room temperature and low voltage stress

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University of Twente
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Microsoft Word - first pages.doc ELECTRICAL INSTABILITY OF a-Si:H/SiN THIN FILM TRANSISTORS A STUDY AT ROOM TEMPERATURE AND LOW VOLTAGE STRESS Composition of the graduation committee: Chairman: Prof. Dr. W. H. M. Zijm University of Twente Secretary: Prof. Dr. W. H. M. Zijm University of Twente Promoters: Prof. Dr. F. G. Kuper University of Twente Prof. Dr. A. J. Mouthaan University of Twente Internal Members: Prof. Dr. J. Schmitz University of Twente Prof. Dr. H. Wallinga University of Twente External Member: Prof. Dr. K. Beenakker Delft University The research was financially supported by Technologiestichting STW. Title: Electrical instability of a-Si:H/SiN thin film transistors. A study at room temperature and low voltage stress Author: Andreea Ruxandra Merticaru Cover picture: www.asi-net.net/asi.htm ISBN 90-365-2056-8 2004 by Andreea Merticaru ELECTRICAL INSTABILITY OF A-Si:H/SiN THIN FILM TRANSISTORS A STUDY AT ROOM TEMPERATURE AND LOW VOLTAGE STRESS DISSERTATION To obtain the doctor’s degree at the University of Twente, on the authority of the rector magnificus, Prof. Dr. F. A. van Vught, on the account of the decision of the graduation committee, to be publicly defended on 11th of June 2004 at 13.15 By Andreea Ruxandra Merticaru born on 22nd of September 1972 in Bucharest, Romania ` This dissertation is approved by promoters: Prof. Dr. F.G.Kuper Prof. Dr. A.J.Mouthaan Things should be made as simple as possible, but not any simpler. (Albert Einstein) To my parents For all their years of patience dedicated to grow up me and my b

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