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Near-field imaging of Bloch surfacewaves on silicon nitride one-dimensionalphotonic crystals

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We perform a near-field mapping of Bloch Surface Waves excited at the truncation interface of a planar silicon nitride multilayer. We directly determine the field distribution of Bloch Surface Waves along the propagation direction and normally to the surface. Furthermore, we present a direct measurement of a near-field enhancement effect under particular coupling conditions. Experimental evidence demonstrates that a ∼ 10^2 near-field intensity enhancement can be realistically attained, thus confirming predictions from rigorous calculations

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