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Deuteron induced secondary electron emission from titanium deuteride surface

Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms
Publication Date
DOI: 10.1016/j.nimb.2012.02.033
  • Secondary Electron Emission
  • Secondary Electron Yield
  • Deuteron Beam
  • Titanium Deuteride


Abstract The secondary electron yield from titanium deuteride surface induced by deuterons was measured in the 80–254keV energy range using a quotient method. The clean surface was produced by removing the oxide layers and absorbed gases on the titanium deuteride target by self-sputtering with deuterons. The maximum value of the secondary electron yield is about 1.37 at 143keV. The secondary electron yield of deuterons in titanium deuteride was compared with the yield of deuterons in Ti, measured in the current study, and with the yield of protons in Ti, measured by Hasselkamp et al. in 1990: values were found to be similar when comparing ions with the same velocity. This suggests the weak influence of the deuteriding process on secondary electron emission. The relation between secondary electron yield and electronic stopping power of deuterons in titanium deuteride was also discussed, with an expansion of the theory of Sternglass. From the results the partition factor B is a little larger than 0.5, which may be related to the derivation from the equipartition rule near the stopping power maximum or to the cascade process which is neglected in the theory of Sternglass.

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