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Ellipsometry and reflectivity at the Brewster angle: tools to study the bending elasticity and phase transitions in monolayers at liquid interfaces

Authors
Journal
Thin Solid Films
0040-6090
Publisher
Elsevier
Publication Date
Volume
234
Identifiers
DOI: 10.1016/0040-6090(93)90310-l

Abstract

Abstract In recent years, two non-perturbative techniques derived from ellipsometry and reflectivity at the Brewster angle have been developed to study monolayers at liquid interfaces. The first is an ellipsometric method to measure the bending elastic modulus of monolayers at the oil-water interfaces. The second is microscopy at the Brewster angle.

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