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Analysis of the melting temperatures of RTX2(CeNiSi2structure) and RT2X2(CeGa2Al2structure) compounds [R=La,Ce,Sm,Er,Tm; T=Fe,Co,Ni; X=Si,Ge]

Authors
Journal
Journal of Alloys and Compounds
0925-8388
Publisher
Elsevier
Publication Date
Volume
264
Identifiers
DOI: 10.1016/s0925-8388(97)00231-4
Keywords
  • Melting Temperature
  • Ternary Rare Earth Silicides
  • Ternary Rare Earth Germanides
  • Crystal Structure
Disciplines
  • Chemistry

Abstract

Abstract Physico-chemical analysis techniques, including X-ray phase analysis and differential thermal analysis were employed for the characterisation of compounds including their melting temperature. The melting temperature of 23 RT 2X 2 compounds belonging to the CeGa 2Al 2 structure has been measured. The melting temperature of 19 RTX 2 compounds belonging to the CeNiSi 2 structure has been measured (LaCoSi 2, LaNiSi 2, CeFeSi 2, CeCoSi 2, CeNiSi 2, SmCoSi 2, SmNiSi 2, ErCoSi 2, ErNiSi 2, TmCoSi 2, TmNiSi 2, LaCoGe 2, LaNiGe 2, CeFeGe 2, CeCoGe 2, CeNiGe 2, SmFeGe 2, SmCoGe 2, SmNiGe 2). It is established, that the new ternary compound SmCoSi 2 belongs to the CeNiSi 2 structure type (group Cmcm, a=0.4088(1) nm, b=1.6320(3) nm, c=0.4008(1) nm).

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