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TEM and XPS analysis of CaxCe1-xO2-y(x = 0.05–0.5) as electrolyte materials for solid oxide fuel cells

Authors
Journal
Acta Materialia
1359-6454
Publisher
Elsevier
Publication Date
Volume
57
Issue
3
Identifiers
DOI: 10.1016/j.actamat.2008.10.014
Keywords
  • Solid Electrolytes
  • Microstructure
  • Transmission Electron Microscopy (Tem)
  • X-Ray Photoelectron Spectroscopy (Xps)
  • Ceo2

Abstract

Abstract The microstructure and conductivity property of Ca-doped CeO 2 were studied in a wide range of dopant concentrations (from 5 to 50 at.%). Through detailed transmission electron microscopy and X-ray photoelectron spectroscopy investigations, we determined the secondary phase besides the doped ceria, clarified the solubility limit for the dopant and specified the reduction behavior of CeO 2 induced by the Ca doping and the associated reduction product. The influences of the microstructures on the ionic conductivity of Ca-doped CeO 2 are discussed, from which the optimal doping level of Ca is suggested.

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