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Design and characteristics of a general purpose atomic force microscope

Authors
Publisher
McGill University
Publication Date
Keywords
  • Engineering
  • Mechanical.
  • Physics
  • General.

Abstract

There are many challenges to building such a system. A major concern is the isolation of the microscope from external vibration sources, such as building vibration, people walking and talking next to the microscope, etc. These vibrations are orders of magnitude larger than the precision needed to detect the small variations of an atomic surface. A number of measures were developed to provide the isolation needed, including a series damping plates that support the microscope.

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