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Anisotropic electric properties of Copper-(II)-Phthalocyanine thin films characterized by a near-field microwave microscope

Authors
Journal
Current Applied Physics
1567-1739
Publisher
Elsevier
Publication Date
Volume
11
Issue
2
Identifiers
DOI: 10.1016/j.cap.2010.06.030
Keywords
  • Cupc
  • Treatment Conditions
  • Field-Effect Transistor
  • Near-Field
  • Microwave Microscope

Abstract

Abstract To study the anisotropic electric transport properties of Copper-(II)-Phthalocyanine (CuPc) thin films we measured the conductivity of a CuPc organic field-effect transistor using a near-field scanning microwave microscope by measuring the microwave reflection coefficient S 11. The orientation of grains depended on the heat-treatment condition and the temperature of the substrate during film deposition. The field-effect mobility of the CuPc thin film annealed at 300 °C was increased about 5 times compared to the film formed at room temperature and 17 times larger than that prepared by deposition at 300 °C.

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