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Temperature dependence of positive secondary ion yields from Fe, Co, Ni, Cu and Cu0.5Ni0.5

Authors
Journal
Applications of Surface Science
0378-5963
Publisher
Elsevier
Publication Date
Volume
6
Issue
1
Identifiers
DOI: 10.1016/0378-5963(80)90054-9

Abstract

Abstract Positive secondary ion sputtering yields S + over the range 25–1200°C for atomic M +, diatomic M + 2, and some impurity ions from Fe, Co, Ni, Cu and Cu 0.5Ni 0.5 have been investigated by secondary ion mass spectrometry (SIMS). A hysteresis effect in S + upon cooling the hot foils and structure in the S + versus temperature curves have been observed. These effects are discussed in terms of migration of impurities and critical transformations in the metals.

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