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Depth profile and quantitative trace element analysis of diffusion aluminided type layers on Ni-base superalloys using high-resolution glow-discharge mass spectrometry

Authors
Journal
Surface and Coatings Technology
0257-8972
Publisher
Elsevier
Publication Date
Volume
139
Issue
1
Identifiers
DOI: 10.1016/s0257-8972(00)01162-2
Keywords
  • Depth Profile
  • Ni-Base
  • Superalloys
  • High-Resolution Glow Discharge Masss Spectrometry

Abstract

Abstract Trace elemental compositions of platinum-aluminide (PtAl) coatings and their depth profiles on nickel base superalloys were studied using high-resolution glow discharge mass spectrometry. Concentration profiles for selected trace elements were investigated from the near-surface regions down to more than 100 microns. The conventional conversion procedure of ion intensities vs. sputtering time into concentration vs. depth was evaluated and corrected with the necessary correction factors. To ensure validity, the roughness of the sputtered craters, crater walls and the nature of the re-deposited materials on the periphery of the craters were inspected.

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