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An atomic force microscopic investigation of electro-sensitive polymer surface

Authors
Journal
Talanta
0039-9140
Publisher
Elsevier
Publication Date
Volume
67
Issue
3
Identifiers
DOI: 10.1016/j.talanta.2005.06.029
Keywords
  • Electro-Sensitive Polymer Surface
  • Afm
  • Adhesion Force
  • Atom Transfer Radical Polymerization

Abstract

Abstract An electro-sensitive poly(2-acrylamide-2-methylpropane sulfonic acid) (PAMPS) film was fabricated by surface-initiated atom transfer radical polymerization (ATRP) method on silicon substrate. Atomic force microscopy (AFM) experiments in contact mode show that friction force and the adhesion force between the AFM tip and the film may change regularly with the alteration of the applied negative bias voltage between them, indicating that the microscopic wettability of the film can be adjusted by external electric field. On the other hand, the AFM experiments in tapping mode reveal that the film may take corresponding phase change under the electric field. These effects were considered to result from the conformational overturn of the sulfonic groups and the adjacent alkyl chains in the electric field.

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