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Optimum Resolution in X-Ray Energy-Dispersive Diffractometry

Wiley-Blackwell Munksgaard
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The resolution problem in X-ray energy-dispersive diffractometry is discussed. It is shown that for a given characteristic of the solid-state detector system and a given range of interplanar spacings, an optimum scattering angle can be easily found for any divergence of the incident and scattered beams.

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