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Characterization of long-periodic layered structures by X-ray diffraction I: A system for small angle and intermediate angle X-ray diffraction using a reflection kratky camera

Authors
Journal
Thin Solid Films
0040-6090
Publisher
Elsevier
Publication Date
Volume
190
Issue
2
Identifiers
DOI: 10.1016/0040-6090(89)90921-8

Abstract

Abstract A high resolution camera has been developed for the small angle X-ray diffraction measurement of long-periodic layered structures such as Langmuir-Blodgett multilayers, superlattices and liquid crystals. A block collimation system known as a Kratky camera is used to produce a very narrow incident beam. The camera is mounted on a computer-controlled goniometer whose sample holder is rotated around a vertical Θ axis by a pulse motor. Measurements can be carried out in a θ-2θ scan, and also in θ or 2θ scans. Processing of the collected data includes smoothing, and correction for absorption, polarization factor and instrumental broadening. The performance of the present system has been demonstrated by observation of diffraction patterns of a Langmuir-Blodgett film of cadmium arachidate and a GaAs/AlAs superlattice.

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