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New concept of criteria in epitaxial pairs

Authors
Journal
Journal of Crystal Growth
0022-0248
Publisher
Elsevier
Publication Date
Volume
275
Identifiers
DOI: 10.1016/j.jcrysgro.2004.11.217
Keywords
  • A1. X-Ray Diffraction
  • A3. Atomic Layer Epitaxy
  • A3. Solid Phase Epitaxy
  • A3. Topotaxy
Disciplines
  • Engineering
  • Medicine

Abstract

Abstract Statistical analysis of a large database of epitaxial pairs proves that the structural accordance in the direction normal to the interface observed from the X-ray diffractograms of the epitaxial pair is much more important for its structural coherency than the structural accordance in the plane of the interface. This fact is of great interest for the prediction of the strength of the epitaxial joints and for the diagnostics of their coherency representing, thus, a sound crystallographic foundation for interface engineering.

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