Publisher Summary Electric charges are omnipresent in dielectric materials; they are produced during material manufacturing, machining, and product usage. Charging an insulator is considered as a simple feature, the consequence of which is the resultant internal electrostatic field produced. Therefore, technological solutions to remedy any deleterious effects of the electric field consist of adapting the geometry of the system, in high voltage capacitors for example. Charge distributions in capacitors are well known to affect and distort local fields around defects, interfaces, and localized changes in material properties. The effects are particularly well observed in the case of constant stress dc fields, as time then permits the buildup of charge that is either injected at electrode-insulator interfaces or possibly is a result of micro-discharges in voids/about defects. This chapter focuses on the study of charge distribution as the trigger for such discharges and illustrates that charges at localized areas can result in macroscopically observed aging/breakdown of the bulk material when they are released disruptively under specific conditions. Such a fundamental understanding supports design at the engineering stage to achieve the necessary life-cycle reliability in practical electronic components/systems. The consequence is that the internal energy concentrated around a trapped charge is released during the detrapping process, producing either local damage (aging) or a catastrophic event according to the circumstances. This new interpretation of processes that strongly limit the life and performances of insulating materials has the advantage of renewing interest in some aging considerations on insulators, and can stimulate new theoretical and experimental fundamental research on materials.