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Raman scattering in sputtered amorphous Ge25Se75- xBixfilms

Authors
Journal
Journal of Non-Crystalline Solids
0022-3093
Publisher
Elsevier
Publication Date
Volume
195
Issue
3
Identifiers
DOI: 10.1016/0022-3093(95)00571-4

Abstract

Abstract Raman spectra of sputtered amorphous Ge 25Se 75- x Bi x films, with x from 0 to 19, have been studied. For x = 0 the typical spectrum of an amorphous GeSe 3 glass is obtained. It is dominated by the peaks at 200 and 220 cm −1, characteristic of the Ge(Se 1 2 ) 4 tetrahedra and a broad peak at 265 cm −1, due to the excess SeSe bonds. The intensity of the 200, 220, 265 cm −1 peaks decrease and a new broad asymmetric peak appears at 175 cm −1 whose intensity increases with the increase of the amount of Bi incorporated into the films. This later peak is attributed to Bi 2Se 3 structural units.

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