Fan, Xuge Wagner, Stefan Schädlich, Philip Speck, Florian Satender, Kataria Haraldsson, Tommy Seyller, Thomas Lemme, Max C. Niklaus, Frank
The shape and density of grain boundary defects in graphene strongly influence its electrical, mechanical, and chemical properties. However, it is difficult and elaborate to gain information about the large-area distribution of grain boundary defects in graphene. An approach is presented that allows fast visualization of the large-area distribution...
Fan, Xuge
This thesis presents a novel approach to integrate chemical vapor deposition (CVD) graphene into silicon micro- and nanoelectromechanical systems (MEMS/NEMS) to fabricate different graphene based MEMS/NEMS structures and explore mechanical properties of graphene as well as their applications such as acceleration sensing, humidity sensing and CO2 se...
Long, Fei Yasaei, Poya Sanoj, Raj Yao, Wentao Král, Petr Salehi-Khojin, Amin Shahbazian-Yassar, Reza
Published in
ACS applied materials & interfaces
Line defects, including grain boundaries and wrinkles, are commonly seen in graphene grown by chemical vapor deposition. These one-dimensional defects are believed to alter the electrical and mechanical properties of graphene. Unfortunately, it is very tedious to directly distinguish grain boundaries from wrinkles due to their similar morphologies....
Canevari, Giacomo
Dans cette thèse, nous nous intéressons aux cristaux liquides nématiques, qui sont une phase de la matière intermédiaire entre les liquides et les solides cristallins ; en particulier, les molécules peuvent se déplacer librement, mais elles tendent à s’orienter localement dans une direction commune. Ces états sont caractérisés par la présence de dé...
Canevari, Giacomo
We consider the Landau-de Gennes variational model for nematic liquid crystals, in three-dimensional domains. We are interested in the asymptotic behaviour of minimizers as the elastic constant tends to zero. Assuming that the energy of minimizers is bounded by the logarithm of the elastic constant, there exists a relatively closed, 1-rectiable set...
Liu, JQ Huang, J Gong, XJ Wang, JF Xu, K Qiu, YX Cai, DM Zhou, TF Ren, GQ Yang, H
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GaN nanowire (NW) arrays have been fabricated by the electrodeless photoelectrochemical (PEC) etching method for the first time. Under appropriate conditions, the etching process is just a dislocation-hunted process, in which the etching solution "digs down'' along the threading dislocations, resulting in the formation of GaN NWs by preferentially ...
wei, m wang, xl pan, x xiao, hl wang, cm yang, cb wang, zg
Crack-free GaN epitaxial layer was obtained through inserting 80 nm graded AlGaN buffer layer between GaN epilayer and high temperature AlN buffer on 2-in Si(111) substrates by metal organic chemical vapor deposition. This paper investigated the influence of AlGaN buffer thickness on the structural properties of the GaN epilayer. It was confirmed f...
jf, he wang, hl shang, xj mf, li zhu, y wang, lj yu, y hq, ni yq, xu niu, zc
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Molecular beam epitaxy growth of GaAs-based long-wavelength metamorphic InAs/InGaAs quantum dots (QDs) is investigated. With optimized multi-step-graded InGaAs metamorphic buffer layers and growth conditions, room temperature 1.46 mu m emission from InAs/In(0.15)Ga(0.85)As QDs is realized, and broad-area laser diodes are fabricated with a very low ...
hu, q wei, tb duan, rf yang, jk huo, zq tc, lu zeng, yp univ, hu q r sichuan
Thick GaN films of high quality are directly grown on wet-etching patterned sapphire in a vertical hydride vapour phase epitaxy reactor. The optical and structural properties of GaN films are studied using scanning electronic microscopy and cathodoluminescence. Test results show that initial growth of hydride vapour phase epitaxy GaN occurs not onl...
zhao, dg jiang, ds zhu, jj liu, zs wang, h zhang, sm wang, yt yang, h chinese, dg r zhao
A close relationship is found between the blue and yellow luminescence bands in n-type GaN films, which are grown without intentional acceptor doping. The intensity ratio of blue luminescence to yellow luminescence (I-BL/I-YL) decreases with the increase in edge dislocation densities as demonstrated by the (102) full width at half maximum of x-ray ...