A new method to measure the carrier concentration of p-GaN
Crack-free GaN epitaxial layer was obtained through inserting 80 nm graded AlGaN buffer layer between GaN epilayer and high temperature AlN buffer on 2-in Si(111) substrates by metal organic chemical vapor deposition. This paper investigated the influence of AlGaN buffer thickness on the structural properties of the GaN epilayer. It was confirmed f...
We investigate the omnidirectional absorption enhancement induced by the excitation of the localized surface plasmon in the hybrid system consisting of a gold nanowire array embedded in a slab waveguide. Assisted by the waveguide layer, the hybrid system can support the localized waveguide-plasmon resonances for a wide range of incident angles. The...
The valence-band offset of the wurtzite ZnO/rutile TiO(2) heterojunction was directly determined by x-ray photoelectron spectroscopy. The wurtzite ZnO (0001) layer was grown on commercial rutile (101) TiO(2) by metal-organic chemical-vapor deposition. The results show that the valence-band offset is 0.14 +/- 0.05 eV, which agrees well with previous...
We observe obviously different diffraction efficiencies with forward and reverse dc voltages in a forced-light-scattering (FLS) experiment for a cell with ZnO nanorod doped in only one poly (vinyl alcohol) (PVA) layer. When a dc voltage with a positive pole on the ZnO nanorod doped side is applied, the excited charge carriers primarily move along t...
We fabricated (Ga,Mn)As/AlO(x)/Co(40)Fe(40)B(20) magnetic tunnel junctions with ferromagnetic semiconductor/insulator/ferromagnetic metal (S/I/F) structure. The treatments of pre-annealing and post-plasma cleaning on the (Ga,Mn) As film were introduced before the growth of the subsequent layers. A high tunneling magnetoresistance (TMR) ratio of 101...