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Huh, Seonguk Kwon, Sang-Hum Lee, Jae-Sang Kang, Jun-Yun Heo, Yoon-Uk Yim, Chang-Hee
An electron probe X-ray microanalyzer (EPMA) is an essential tool for studying chemical composition distribution in the microstructure. Quantifying chemical composition using standard specimens is commonly used to determine the composition of individual phases. However, the local difference in chemical composition in the standard specimens brings t...
Gheno, T. Monceau, D. Oquab, D. Cadoret, Y.
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Oxidation of Metals
Sulfur segregation was characterized by secondary ion mass spectrometry (SIMS) in uncoated single-crystal Ni-based AM1 superalloys with various S contents and on NiPtAl, NiAl and NiPt bondcoats of complete TBC systems. In spite of technical difficulties associated with diffuse sputtered interfaces, an original sample preparation technique and a car...
