Reducing the Source Resistance by Increasing the Gate Effect on Substrate for Future Terahertz HEMT Device
In this paper, we present the dependence of source resistance sensibility on the gate bias effect in a High Electron Mobility Transistor (HEMT) using the Drift-Diffus (D-D) model with the SILVACO Technology Computer-Aided Design (TCAD) tool. The obtained results show that the increases of gate bias effect on substrate lead to decreasing the source ...