Heynderickx, Philippe
Dynamic headspace sampling is an important technique for the analysis of consumer products, the study of biological samples and environmental water analyses. This paper shows the influence of experimental conditions, such as the sampling time, sampling flow rate, headspace volume, liquid volume and Henry coefficient on the measured average concentr...
Alejo, R. Monroy-de-Jesús, J. Ambriz-Polo, J. C. Pacheco-Sánchez, J. H.
Published in
Neural Computing and Applications
In this paper, we present an improved dynamic sampling approach (I-SDSA) for facing the multi-class imbalance problem. I-SDSA is a modification of the back-propagation algorithm, which is focused to make a better use of the training samples for improving the classification performance of the multilayer perceptron (MLP). I-SDSA uses the mean square ...
Nduhura Munga, Justin DAUZERE-PERES, Stéphane Yugma, Claude Vialletelle, Philippe
In a globally competitive environment, sustaining high yield with a minimum number of quality controls is key for manufacturing plants to remain competitive. In modern semiconductor manufacturing facilities, with the moves to ever smaller geometries and the variety among products to be run concurrently, designing efficient control plans is becoming...
Nduhura Munga, Justin DAUZERE-PERES, Stéphane Yugma, Claude Vialletelle, Philippe
In a globally competitive environment, sustaining high yield with a minimum number of quality controls is key for manufacturing plants to remain competitive. In modern semiconductor manufacturing facilities, with the moves to ever smaller geometries and the variety among products to be run concurrently, designing efficient control plans is becoming...
Nduhura Munga, Justin Dauzère-Pérès, Stéphane Vialletelle, Philippe Yugma, Claude
In a worldwide environment, sustaining high yield with a minimum number of quality controls is key for manufacturing plants to remain competitive. In high-mix semiconductor plants, where more than 200 products are concurrently run, the complexity of designing efficient control plans comes from the larger amount of data and number of production para...
Nduhura-Munga, Justin Dauzère-Pérès, Stéphane Yugma, Claude Vialletelle, Philippe
Worldwide competition, the move to ever smaller geometries in manufacturing processes, and the increasing of complexity in High-Mix semiconductor plants led to the introduction of numerous controls at different manufacturing stages. However, with the costs associated to metrology, i.e. non added value operations, it becomes increasingly important a...
Huang, C.-H. Veillard, A. Roux, L. Loménie, N. Racoceanu, D.
10.1016/j.compmedimag.2010.11.009 / Computerized Medical Imaging and Graphics / 35 / 7-8 / 579-591 / CMIGE