CLIL across the Curriculum, benefits that go beyond the classroom
The level of fluency in the genre specific language of schooling, also known as Academic English (AE), determines students’ success in school. Government agencies that legislate school policies therefore give teachers the directive to conduct education in ways that promote communicative abilities in academic English across all curricula. While the ...
The higher density of integration and lower supply voltage have led to lower noise margins and a smaller amount of charge representing a bit of information. The International Technology Roadmap for Semiconductors (ITRS) stated that below 65 nm CMOS Technology soft errors impact field-level circuit reliability, not only for embedded memories, but fo...
The aim of this essay was to investigate whether pupils with higher grades based on formative assessment were more successful at adapting informal texts into formal texts.Six pupils in English 7 were asked to write an informal blog entry about their favorite hobby/pastime and a formal entry also about their favorite hobby/pastime intended for an En...
nrpages: 78 / status: published
status: published
Published in Journal of Electronic Testing
In this paper, we propose three new built-in current sensors (BICS) topologies for on-chip IDDQ tests of analog/mixed-signal (AMS) circuits with the objective to achieve low design complexity, small area overhead and high accuracy. The first two approaches are derived from digital varicap threshold logic (VcTL) gate idea where the structure is modi...
Le test en production des circuits intégrés analogiques RF (Radio Fréquences) est coûteux aussi bien en ressources (équipement spécifique) qu'en temps. Afin de réduire le coût du test, des techniques de DfT (Design for Test) et d'auto test (BIST, Built-in-Self-Test) sont envisagées bien qu'actuellement inutilisées par l'industrie du semi-conducteur...
I denna studie undersöks hur några före detta IVIK–elever har lyckats med sina gymnasiestudier på ett treårigt nationellt program. Jag har intervjuat fyra informanter, två flickor som läser sitt andra år och två pojkar som läser sitt tredje och sista år. Viktigt att påpeka är att de elever som intervjuats i denna studie är mycket ambitiösa och målm...
Published in Analog Integrated Circuits and Signal Processing
Built-in current sensor (BICS) is known to enhance test accuracy, defect coverage of quiescent current (IDDQ) testing method in CMOS VLSI circuits. For new deep-submicron technologies, BICSs become essential for accurate and practical IDDQ testing. This paper presents a new BICS suitable for power dissipation measurement and IDDQ testing. Although ...