MEASURING DEVICE, INFORMATION PROCESSING DEVICE, INFORMATION PROCESSING METHOD, AND PROGRAM
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Applicant
Canon Kabushiki Kaisha
Representative
Application number
EP18738689A1
Kind
A1
Document number
3570011
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MEASURING DEVICE, INFORMATION PROCESSING DEVICE, INFORMATION PROCESSING METHOD, AND PROGRAM

3570011 - EP18738689A1 - EPO

Application Jan 11, 2018 - Publication Nov 20, 2019

Hiroshi KAWANAGO Yukie KUROKI

Abstract

The present invention provides a measurement apparatus characterized by comprising: a measurement unit configured to measure a reflection characteristic of a surface; an image capturing unit configured to, by image-capturing a measurement region on the surface on which the reflection characteristicis measured by the measurement unit, obtain an image of the measurement region; and a control unit configured to cause a display unit to display a plurality of measurement results obtained by a plurality of times of measurement by the measurement unit, wherein the control unit causes the display unit to display the image obtained by the image capturing unit which corresponds to a measurement result selected from the plurality of measurement results, together with the plurality of measurement results.

Description

Claims

Patent References

Patent Publication Date Title
JP2002508076A N/A N/A
JP2017004612A N/A N/A
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